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Algorithmic chip-design loops

Is the farthest-point spread's lead over random draws, when adapting a chip-design cost model to a new family, bigger than split noise?

research/eda-adaptci

eda-adaptfixed re-run with 40 splits per family and bootstrap intervals: for the linear model the spread beats random draws at every k (about 1 point of error at 3 to 8 designs, 2.5 at 2), but for ridge it loses at 3 designs and one family (sorter) reverses the sign, so the pooled interval is narrower than the real uncertainty.

7 tests

What it found

Same 133 Yosys-synthesised designs in four families, fixed 40% test set per family, new-family weight 5. Over 40 splits × 4 families the paired gap APE(spread) − APE(random) has a 95% bootstrap interval excluding zero for the linear model at k = 2, 3, 5, 8 (median −2.45, −0.71, −1.01, −0.73 points) and for ridge except k = 3, where the spread is worse (+1.00, interval +0.19 to +1.90). The extremes chooser is worse than random at k = 2 to 3. The alu family drives the largest gaps and sorter reverses the sign at k = 3 and 5. The intervals reflect split noise on the same designs, not a population of families, and are narrow for that reason. Inputs are the committed dataset (Yosys 0.33 counts); weights and scaling are untuned defaults.

A figure from its own output

Figure produced by research/eda-adaptci: gap_spread
eda-adaptci/experiments/gap_spread.svg, written by the project's own experiment code.

Paper, code and results

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Produced with AI assistance (Claude). Results are from the code in this repository and are simulated or stylised unless the abstract says otherwise; nothing here implies affiliation with or endorsement by any lab, researcher or company cited. MIT licensed.